Echirolles, France

Stéphane Wolozan

This inventor holds 1 USPTO granted patent and 3 published patent applications and 3 EPO patents. Top assignee: Schneider Electric Industries Sas. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Stéphane Wolozan. Retrieved from https://idiyas.com/inventor/stéphane-wolozan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Stéphane Wolozan: Innovator in Electrical Measurement Technologies

Introduction: Stéphane Wolozan is an inventor based in Echirolles, France. He has contributed to the field of electrical measurement technologies through his innovative ideas and applications. Although he currently holds no granted patents, his work reflects a commitment to advancing technology in his area of expertise.

Latest Patent Applications: Stéphane Wolozan has submitted several notable patent applications. One of his latest applications is titled "Frame with Magnetic Properties for a Beehive." This invention features a hive frame that includes bars joined together and a central plate framed by the bars. The central plate is made from a binder with added magnetic powder and is magnetized in a direction transverse to its two opposite sides. Another significant application is for a "Device for Measuring Electrical Quantities in an Electrical Installation and Associated System." This device is designed to measure electrical quantities within an installation and includes a housing with a unitary block that accommodates an electrical conductor. The device features modules for current measurement, voltage measurement through capacitive coupling, and a power supply module, all arranged around the conductor's through-slot.

Conclusion: Stéphane Wolozan's innovative spirit and dedication to developing new technologies in electrical measurement are evident in his latest patent applications. His contributions may pave the way for future advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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