Sravan Kumar Bhaskarani

Title: Innovations of Sravan Kumar Bhaskarani

Introduction

Sravan Kumar Bhaskarani is a notable inventor based in Karnataka, India. He has made significant contributions to the field of embedded memory testing, holding 2 patents that showcase his innovative approach to technology.

Latest Patents

One of his latest patents is titled "Locally synchronous shared BIST architecture for testing embedded memories with asynchronous interfaces." This invention discloses a system and method for sharing testing components for multiple embedded memories. The memory system includes multiple test controllers, interface devices, a main controller, and a serial interface. The main controller initializes testing for each dissimilar memory group using a serial interface and local test controllers. This innovative memory system results in reduced routing congestion and faster testing of a plurality of dissimilar memories. Furthermore, the patent provides a programmable shared built-in self-testing (BIST) architecture utilizing globally asynchronous and locally synchronous (GALS) methodology for testing multiple memories. The BIST architecture comprises a programmable master controller, multiple memory wrappers, and an interface that can be a GALS interface.

Career Highlights

Sravan Kumar Bhaskarani is currently employed at STMicroelectronics Pvt. Ltd., where he continues to develop and refine his innovative ideas in the field of embedded systems. His work has significantly impacted the efficiency and effectiveness of memory testing processes.

Collaborations

He has collaborated with notable coworkers such as Prashant Dubey and Akhil Garg, contributing to a dynamic and innovative work environment.

Conclusion

Sravan Kumar Bhaskarani's contributions to the field of embedded memory testing through his patents reflect his dedication to innovation and technology. His work continues to influence advancements in the industry, showcasing the importance of inventive minds in shaping the future.