Siu Keung Kwok

Title: **Siu Keung Kwok: Innovating Process Control with Physimetric Property Identification**

Introduction

Siu Keung Kwok is a prominent inventor based in Hung Hom, China. He has made significant contributions to the field of automated process control, evidenced by his innovative patent focusing on physimetric property identification. His work not only showcases his inventive spirit but also reflects the importance of advancements in technology for improving operational efficiencies in various industries.

Latest Patents

Siu Keung Kwok holds a patent titled "Physimetric property identification of physical object for process control." This invention presents a method for automating process control operations. In brief, the process involves directing a physical object into a read zone, retrieving information from an ID Container attached to the object, and capturing its physimetric properties. The retrieved information and captured properties are then processed and compared using an analysis algorithm. The outcomes determine if the physical object will continue through the read zone or needs to be adjusted by an operator, enhancing accuracy and efficiency in process management.

Career Highlights

Siu Keung Kwok is a valuable member of the academic community at The Hong Kong Polytechnic University. His position allows him to blend research and practical application, contributing significantly to the field of engineering and process control. His patent serves as a testament to his innovative approach to solving complex problems in technology.

Collaborations

Throughout his career, Siu Keung Kwok has collaborated with talented individuals including Chi Fai Cheung and Hing Choi Tsang. These collaborations highlight the importance of teamwork in the innovation process and underline the collective effort to advance research and development in their field.

Conclusion

Siu Keung Kwok's inventive mind and contributions to the field of automated process control play a crucial role in enhancing technology applications. His patent on physimetric property identification not only provides a method for improved process management but also reflects the continuous evolution of innovations within the industry. As he continues his work at The Hong Kong Polytechnic University, further advancements are anticipated, showcasing the ongoing impact of his research and development efforts on the future of technology.