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Years Active: 2020-2023
Title: Simon Scheuring: Innovator in Atomic Force Microscopy
Introduction
Simon Scheuring is a prominent inventor based in New York, NY (US). He has made significant contributions to the field of atomic force microscopy, holding a total of 3 patents. His innovative work has advanced the capabilities of this technology, making it more efficient and effective.
Latest Patents
One of Simon Scheuring's latest patents is a phase-shift-based amplitude detector for a high-speed atomic force microscope. This invention involves a cantilever operating in amplitude modulation mode. A controller determines the amplitude of the cantilever oscillation by processing a signal representative of the cantilever motion. This is achieved by square-rooting a signal that is substantially equal to the sum of a square of the received signal and a squared and phase-shifted version of the received signal. The processing can be implemented using analog circuit components, enhancing the performance of atomic force microscopes.
Career Highlights
Throughout his career, Simon has worked with esteemed institutions such as Cornell University and the Institut National de la Santé et de la Recherche Médicale (Inserm). His work in these organizations has allowed him to collaborate with leading experts in the field and contribute to groundbreaking research.
Collaborations
One of his notable collaborators is Atsushi Miyagi. Their partnership has fostered innovative ideas and advancements in atomic force microscopy.
Conclusion
Simon Scheuring's contributions to atomic force microscopy through his patents and collaborations highlight his role as a key innovator in the field. His work continues to influence the development of advanced microscopy techniques.