Company Filing History:
Years Active: 2014-2015
Title: Simon Billinge: Innovator in X-ray Characterization and Electron Diffraction
Introduction
Simon Billinge is a prominent inventor based in Brooklyn, NY. He has made significant contributions to the field of materials science, particularly in the characterization of organic materials and the processing of electron diffraction data. With a total of 3 patents to his name, Billinge's work has advanced the understanding of small molecule organic materials and their applications.
Latest Patents
One of Billinge's latest patents is focused on the X-ray characterization of solid small molecule organic materials. This invention provides methods for characterizing small molecule organic materials, such as drugs or drug products. The method involves subjecting the solid material to X-ray total scattering analysis at a short wavelength, collecting the generated data, and mathematically transforming it to yield a refined dataset. Another notable patent is a method for collecting and processing electron diffraction data. This method utilizes electron diffraction to obtain pair distribution functions (PDFs) from various types of compounds, including crystalline, nanocrystalline, and amorphous inorganic, organic, and organometallic materials.
Career Highlights
Simon Billinge is affiliated with Columbia University, where he continues to engage in innovative research and development. His work has garnered attention in the scientific community, contributing to advancements in material characterization techniques.
Collaborations
Billinge has collaborated with notable colleagues, including Kenneth Shankland and Norman Shankland. These collaborations have further enriched his research and expanded the impact of his inventions.
Conclusion
Simon Billinge's contributions to the field of materials science through his patents and research at Columbia University highlight his role as an influential inventor. His innovative methods for characterizing organic materials and processing electron diffraction data continue to shape advancements in the industry.