Shuai Shi

Title: Innovations of Shuai Shi in Magnetic Flux Leakage Simulation

Introduction

Shuai Shi is an accomplished inventor based in Chengdu, China. He has made significant contributions to the field of magnetic flux leakage simulation. His innovative approach has led to the development of a unique method that enhances the understanding of magnetic field distributions.

Latest Patents

Shuai Shi holds a patent for a method titled "Method for simulating magnetic flux leakage based on loop current." This invention provides a systematic approach to simulating magnetic flux leakage by utilizing loop currents. The method involves obtaining the magnetic distribution of a single loop current through solid angles. It further derives the magnetic field distribution of a semi-infinite solenoid based on the arrangement of loop currents in a magnetized specimen. The introduction of the JA hysteresis model allows for the determination of the distribution of the quasi-static magnetic flux leakage field. This innovative method analyzes the relationship between the distribution of loop currents on the surface of defects and the excitation magnetic field.

Career Highlights

Shuai Shi is affiliated with the University of Electronic Science and Technology of China. His work at this prestigious institution has allowed him to explore and develop advanced methodologies in magnetic field analysis. His research has garnered attention for its practical applications in various engineering fields.

Collaborations

Shuai Shi has collaborated with notable colleagues, including Yuhua Cheng and Libing Bai. Their joint efforts have contributed to the advancement of research in magnetic flux leakage and related technologies.

Conclusion

Shuai Shi's innovative contributions to the field of magnetic flux leakage simulation demonstrate his expertise and commitment to advancing technology. His patent and collaborative efforts highlight the importance of research in understanding complex magnetic phenomena.