Mumbai, India

Shree Prakash Tiwari


Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2013

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1 patent (USPTO):

Title: Innovations of Shree Prakash Tiwari in Ionizing Radiation Detection

Introduction

Shree Prakash Tiwari is an accomplished inventor based in Mumbai, India. He has made significant contributions to the field of ionizing radiation detection through his innovative patent. His work is particularly relevant in various scientific and industrial applications where radiation measurement is crucial.

Latest Patents

Shree Prakash Tiwari holds a patent for a "Method and device for determining ionizing radiation." This invention involves a method for determining ionizing radiation by applying a constant voltage across an organic semiconducting material sensor before and after exposure to ionizing radiation. The process includes measuring and converting the current passing through the sensor, which is proportional to the conductivity or resistivity of the sensor. This, in turn, is proportional to the ionizing radiation detected. The invention also features an electronic device that comprises an organic semiconductor resistor, a constant voltage source, a current to voltage converter, an analog to digital converter, and a microprocessor.

Career Highlights

Shree Prakash Tiwari is affiliated with the Indian Institute of Technology Bombay, where he contributes to research and development in the field of semiconductor technology and radiation detection. His work has implications for safety and monitoring in environments where ionizing radiation is present.

Collaborations

He collaborates with notable colleagues such as Harshil Narendra Raval and Ramesh Raju Navan, enhancing the research output and innovation potential within his team.

Conclusion

Shree Prakash Tiwari's innovative approach to ionizing radiation detection exemplifies the importance of research and development in advancing technology. His contributions are vital for ensuring safety and accuracy in radiation measurement applications.

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