Company Filing History:
Years Active: 1999
Title: **Shouji Kanbe: Innovator in Semiconductor Defect Classification**
Introduction
Shouji Kanbe, based in Hiranocho, Japan, is a notable inventor recognized for his significant contribution to the field of semiconductor technology. With one patent to his name, Kanbe has developed an innovative method and apparatus that enhances the classification of defects found on semiconductor wafers.
Latest Patents
Kanbe's sole patent, titled "Method and apparatus for classifying a defect on a semiconductor wafer," describes a process in which a surface image of a defective semiconductor wafer is captured as an inspection image. In contrast, a surface image of a wafer lacking defects is stored as a reference image. By analyzing the density difference between these images, Kanbe's method extracts defect images from both wiring and non-wiring regions. This technique allows for the determination of the defect type and identifies the specific production process where the defect originated.
Career Highlights
Throughout his career, Shouji Kanbe has contributed his expertise to prominent companies in the industry. Notably, he has worked with Kabushiki Kaisha Kobe Seiko Sho, a well-respected company known for its advanced technologies, as well as Texas Instruments Japan Limited, a key player in the semiconductor market. His work in these organizations has furthered the understanding and development of semiconductor technologies.
Collaborations
Kanbe has collaborated with talented individuals in the field, including colleagues Shingo Sumie and Tsutomu Morimoto. These partnerships have fostered innovation and contributed to advancements in semiconductor defect classification methodologies.
Conclusion
Shouji Kanbe's inventive work on semiconductor wafers and his patented method represent significant advancements in defect classification within the technology sector. His collaborations and experiences at leading companies demonstrate the impact of his contributions, solidifying his role as a valuable inventor in the world of semiconductor technology.