Company Filing History:
Years Active: 1995-1997
Title: Innovations of Shinwu Chiang
Introduction
Shinwu Chiang is a notable inventor based in Yorktown Heights, NY (US). He has made significant contributions to the field of testing and fault isolation for high-density passive boards and substrates. With a total of 2 patents, his work has advanced the capabilities of electronic testing.
Latest Patents
Chiang's latest patents focus on systems and methods for testing and fault isolation of high-density passive boards. These patents disclose apparatus and methods that utilize a small number of moving probes to perform simultaneous network resistance and network capacitance measurements. This innovative approach minimizes test time by eliminating the need for electrical switching and excessive probe movement during the testing of normal circuit board networks. Additionally, simultaneous network capacitance and network leakage measurements are achieved through phase-sensitive detection. The dual-frequency measurement techniques allow for the assessment of both capacitance and resistance values of leakage paths between the measured network and unknown networks. Furthermore, any leakage resistance between the network under test and ground or power planes within the circuit board can be determined from these measurements. This method also enables simultaneous independent net-to-plane capacitance characterization using signals of mutually independent frequencies, resulting in improved defect detection capabilities.
Career Highlights
Shinwu Chiang is currently employed at International Business Machines Corporation (IBM), where he continues to innovate in the field of electronic testing. His work has been instrumental in enhancing the efficiency and accuracy of testing processes in high-density electronic applications.
Collaborations
Chiang has collaborated with notable coworkers such as Huntington W. Curtis and Arthur E. Falls, contributing to the advancement of technology in their respective fields.
Conclusion
Shinwu Chiang's contributions to the field of electronic testing through his innovative patents have significantly improved testing methodologies. His work at IBM and collaborations with esteemed colleagues further highlight his impact on the industry.