Tokyo, Japan

Shinsuke Shibata

USPTO Granted Patents = 1 

 

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2024

Loading Chart...
Loading Chart...
1 patent (USPTO):Explore Patents

Title: Shinsuke Shibata: Innovator in Sample Preparation Systems

Introduction

Shinsuke Shibata is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of electron microscopy through his innovative patent. His work focuses on enhancing the sample preparation process, which is crucial for accurate electron microscope observations.

Latest Patents

Shibata holds a patent for a "Sample preparation system and method for electron microscope observation, and tape feeding mechanism used for sample preparation." This invention provides a sample preparation system that enables electron microscope observation of a sample slice with a simple structure and process. The system includes a plasma treatment apparatus and a sputtering apparatus, along with a slice collecting apparatus. The plasma treatment apparatus continuously hydrophilizes the resin tape, while the sputtering apparatus imparts conductivity to the tape. This innovative approach allows for efficient collection of slices cut from a sample onto the treated resin tape.

Career Highlights

Throughout his career, Shinsuke Shibata has worked with prominent organizations such as Sanyu Electron Co., Ltd. and Keio University. His experience in these institutions has contributed to his expertise in the field of electron microscopy and sample preparation technologies.

Collaborations

Shibata has collaborated with notable colleagues, including Tomoko Shindo and Hideyuki Okano. Their combined efforts have further advanced the research and development of innovative technologies in sample preparation.

Conclusion

Shinsuke Shibata's contributions to the field of electron microscopy through his innovative patent demonstrate his commitment to advancing scientific research. His work continues to impact the way samples are prepared for observation, enhancing the capabilities of electron microscopy.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…