Kawasaki, Japan

Shinichiro Ohtaka


Average Co-Inventor Count = 6.0

ph-index = 2

Forward Citations = 74(Granted Patents)


Company Filing History:


Years Active: 1992-1993

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2 patents (USPTO):Explore Patents

Title: Innovations of Shinichiro Ohtaka

Introduction

Shinichiro Ohtaka is a notable inventor based in Kawasaki, Japan. He has made significant contributions to the field of temperature measurement technology. With a total of 2 patents to his name, Ohtaka's work reflects a commitment to advancing measurement apparatuses.

Latest Patents

Ohtaka's latest patents include an innovative apparatus for temperature measurement. This apparatus consists of a sensing element, a retaining element made of a thermally conductive and electrically insulative material, a holding element, and a contact mechanism that elastically contacts the retaining element with the surface of the measured body. The sensing element is composed of a thin film thermistor formed on an electrically insulating layer on a substrate. Additionally, a film made of thermally conductive and electrically insulative material may be inserted between the measured body and the contact area of the retaining element. The retaining element is constructed from a polyimide film and a flexible copper lead foil connected to the electrodes of the sensing element. The contact mechanism features a pressing frame with at least one pressing arm that presses the contact part of the retaining element to the measured body.

Career Highlights

Ohtaka is currently employed at NKK Corporation, where he continues to develop innovative technologies. His work has garnered attention for its practical applications in various industries.

Collaborations

Some of his notable coworkers include Takeo Yamada and Mitsuya Otonari, who have collaborated with him on various projects.

Conclusion

Shinichiro Ohtaka's contributions to temperature measurement technology exemplify his innovative spirit and dedication to advancing the field. His patents reflect a deep understanding of the complexities involved in accurate temperature measurement.

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