Location History:
- Machida, JP (1995)
- Kawasaki, JP (1994 - 2000)
- Tokyo, JP (2004)
- Kashiwa, JP (2006 - 2009)
- Kawashiwa, JP (2015)
Company Filing History:
Years Active: 1994-2015
Title: Innovations by Shin Mogi
Introduction
Shin Mogi is a prominent inventor based in Kashiwa, Japan. He has made significant contributions to the field of optical scanning technology, holding a total of 9 patents. His work is characterized by innovative designs that enhance the functionality and efficiency of optical devices.
Latest Patents
Among his latest patents is an "Optical scanning apparatus with optical box sealed by a deformable sealing member." This invention features a scanning optical apparatus that includes an optical box accommodating a deflection device for scanningly deflecting a laser beam emitted by a light source. The design incorporates a cap mounted to the optical box and a sealing member made of a material that deforms more easily than the cap, ensuring a secure fit. Another notable patent is the "Optical scanning apparatus," which presents a compact design capable of changing the focal position of a light beam at high speed. This apparatus utilizes a collimating lens formed by a KTN crystal, with electrodes strategically placed inside and outside the lens.
Career Highlights
Shin Mogi has dedicated his career to advancing optical technology, particularly through his work at Canon Kabushiki Kaisha. His innovative approach has led to the development of cutting-edge optical scanning devices that are widely recognized in the industry.
Collaborations
Throughout his career, Mogi has collaborated with esteemed colleagues such as Kazuo Uzuki and Yoshinori Sugiura. These partnerships have fostered a creative environment that has resulted in numerous advancements in optical technology.
Conclusion
Shin Mogi's contributions to optical scanning technology exemplify his innovative spirit and dedication to enhancing device functionality. His patents reflect a commitment to pushing the boundaries of what is possible in the field.