Shin-ichi Ohkawa

Title: Shin-ichi Ohkawa: Innovator in Semiconductor Technology

Introduction

Shin-ichi Ohkawa is a notable inventor based in Yamato, Japan. He has made significant contributions to the field of semiconductor technology, particularly through his innovative patent.

Latest Patents

Ohkawa holds a patent for a semiconductor characteristic evaluation apparatus. This invention features a basic measurement unit arranged in a lattice shape on a chip. It includes a resistance measurement circuit, a capacity measurement circuit, an n-type MOS transistor measurement circuit, a p-type MOS transistor measurement circuit, and a ring oscillator measurement circuit, all mounted in several tens of patterns. Each measurement circuit is connected to a measurement bus, which constitutes a measurement bus net according to the measured items. The switching of the connection of the measurement bus net with a measurement terminal pad is electrically controlled by X, Y address selection signals outputted from X, Y address decoders to X, Y address selection signal lines.

Career Highlights

Ohkawa is affiliated with the Semiconductor Technology Academic Research Center, where he continues to advance research and development in semiconductor technologies. His work has been instrumental in enhancing the efficiency and accuracy of semiconductor evaluations.

Collaborations

Ohkawa collaborates with Masakazu Aoki, contributing to the advancement of semiconductor technology through shared expertise and innovative ideas.

Conclusion

Shin-ichi Ohkawa's contributions to semiconductor technology through his patent and collaborative efforts highlight his role as a key innovator in the field. His work continues to influence advancements in semiconductor evaluation methods.