Tokyo, Japan

Shin-ichi Nakajima


Average Co-Inventor Count = 1.8

ph-index = 2

Forward Citations = 22(Granted Patents)


Company Filing History:


Years Active: 1994-1996

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2 patents (USPTO):Explore Patents

Title: Innovations of Shin-ichi Nakajima

Introduction

Shin-ichi Nakajima is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of optical measurement technology. With a total of 2 patents, his work showcases innovative methods and apparatuses that enhance measurement accuracy.

Latest Patents

One of his latest patents is the "Relative azimuth measuring method and apparatus." This invention involves a measuring section of a target tracer that emits light toward a reflector. The reflector is designed with a light reflection factor that increases toward its center, featuring areas of varying reflection factors arranged concentrically. The reflected light is captured by an imaging element, which scans a two-dimensional image and generates electric signals. A threshold value comparing circuit selects electric signals above a certain threshold as azimuth signals. An angle calculating circuit then determines the center of the reflector's image and calculates the azimuth and elevation angles of the target. Another notable patent is the "Distributed feedback semiconductor laser," which further demonstrates his expertise in optical technologies.

Career Highlights

Shin-ichi Nakajima has worked with prominent companies such as Optical Measurement Technology Development Co., Ltd. and NEC Corporation. His experience in these organizations has allowed him to refine his skills and contribute to groundbreaking innovations in optical measurement.

Collaborations

Throughout his career, Nakajima has collaborated with talented individuals, including Kunio Tada and Yoshiaki Nakano. These partnerships have fostered a creative environment that has led to the development of his innovative patents.

Conclusion

Shin-ichi Nakajima's contributions to optical measurement technology are noteworthy. His patents reflect a deep understanding of measurement systems and their applications. His work continues to influence the field and inspire future innovations.

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