Title: Shih-Chang Wang: Innovator in Semiconductor Technology
Introduction: Shih-Chang Wang is a talented inventor based in Hsinchu, Taiwan. She is currently associated with Skyla Corporation Hsinchu Science Park Branch. With a focus on semiconductor technology, she has made significant contributions to the field, particularly in the area of defect detection.
Latest Patent Applications: Shih-Chang Wang has filed a patent application for a "Hot Spot Defect Detecting Method and Hot Spot Defect Detecting System." This innovative method involves extracting hot spots from the design of a semiconductor product to create a hot spot map. The map comprises hot spot groups, where local patterns in the same context yield identical image content. During runtime, defect images obtained from an inspection tool performing hot scans on a wafer are aligned with the hot spot map to locate the hot spot groups. The method dynamically maps these groups to various threshold regions, allowing for automatic thresholding on pixel values of the hot spots.
Conclusion: Shih-Chang Wang's work in semiconductor technology showcases her innovative spirit and dedication to advancing the field. Her contributions, particularly in defect detection, highlight the importance of precision in semiconductor manufacturing.
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