Company Filing History:
2 out of 1,430 
2 out of 348 Years Active: 1994
Title: Shigeru Kokaji: Innovator in Optical Measurement and Signal Analysis
Introduction
Shigeru Kokaji is a notable inventor based in Tsukuba, Japan. He has made significant contributions to the fields of optical measurement and signal analysis, holding a total of 2 patents. His innovative work has advanced the understanding and application of optical technologies.
Latest Patents
One of Kokaji's latest patents is the "Shearing interferometer for measuring lens lateral aberration." This device measures the aberration of a lens by passing a beam through it, splitting the beam into multiple beams using a slightly wedged plate, and causing interference between the wavefronts of the beams. The front and rear optical surfaces of the wedged plate are coated with reflective thin films, each having specific reflectance and transmittance properties. Another significant patent is the "Time series signal multichannel frequency analyzer using liquid crystal." This analyzer comprises a Fourier transform lens and a liquid crystal panel positioned at the front focal plane of the lens. It allows for the input of time signals from different sources to each scanning line of the liquid crystal panel, enhancing the analysis of time series signals.
Career Highlights
Kokaji has worked with prominent organizations, including the Agency of Industrial Science and Technology and the Ministry of International Trade and Industry. His experience in these institutions has contributed to his expertise in optical technologies and signal processing.
Collaborations
Throughout his career, Kokaji has collaborated with notable individuals such as Kiyofumi Matsuda and Thomas H. Barnes. These collaborations have further enriched his work and expanded the impact of his inventions.
Conclusion
Shigeru Kokaji's contributions to optical measurement and signal analysis demonstrate his innovative spirit and dedication to advancing technology. His patents reflect a deep understanding of complex systems and a commitment to improving measurement techniques.