Yokohama, Japan

Shigeru Kakuta

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi, Ltd.. Active years: 2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shigeru Kakuta. Retrieved from https://idiyas.com/inventor/shigeru-kakuta-hswvb665

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: Shigeru Kakuta: Innovator in Semiconductor Manufacturing

Introduction

Shigeru Kakuta is a notable inventor based in Yokohama, Japan. He has made significant contributions to the field of semiconductor manufacturing, particularly through his innovative patent.

Latest Patents

Kakuta holds a patent for a plasma treatment method and manufacturing method of semiconductor devices. This invention provides a dry cleaning method capable of removing deposition films that adhere to the inner walls of semiconductor manufacturing apparatuses. The method effectively eliminates dust production sources, thereby enhancing the manufacturing yield and working efficiency of the apparatus.

Career Highlights

Shigeru Kakuta is associated with Hitachi, Ltd., where he has applied his expertise in semiconductor technology. His work has been instrumental in improving processes that are critical to the semiconductor industry.

Collaborations

Kakuta has collaborated with notable colleagues such as Hiroyuki Kitsunai and Nobuo Tsumaki. Their combined efforts have contributed to advancements in semiconductor manufacturing techniques.

Conclusion

Shigeru Kakuta's innovative work in semiconductor manufacturing exemplifies the importance of research and development in technology. His contributions continue to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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