Hsin-Chu County, Taiwan

Shiaw-Yu Jou


Average Co-Inventor Count = 2.3

ph-index = 1


Location History:

  • Hsin-Chu County, TW (2018 - 2023)
  • Hsin-Chu, TW (2024)

Company Filing History:


Years Active: 2018-2025

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6 patents (USPTO):Explore Patents

Title: Shiaw-Yu Jou: Innovator in Optical Measurement Technologies

Introduction

Shiaw-Yu Jou is a prominent inventor based in Hsin-Chu County, Taiwan. He has made significant contributions to the field of optical distance measurement systems, holding a total of six patents. His innovative work has advanced the accuracy and efficiency of electronic devices.

Latest Patents

One of his latest patents is an optical distance measurement system with dynamic exposure time. This system includes an image sensor and a processing unit that generates an image based on at least one captured image. The unique feature of this invention is that different regions of the image correspond to varying exposure times, which enhances the accuracy of distance calculations. Another notable patent is a device ID setting method and an electronic device that applies this method. This electronic device comprises a clock pin, at least one data pin, and a storage device that stores a program. The device ID setting method records connections between pins of a first electronic device and the electronic device itself, allowing for efficient identification and communication.

Career Highlights

Shiaw-Yu Jou is currently employed at Pixart Imaging Incorporated, where he continues to develop innovative technologies. His work has been instrumental in pushing the boundaries of optical measurement and electronic device functionality.

Collaborations

He has collaborated with notable coworkers, including Guo-Zhen Wang and En-Feng Hsu, contributing to various projects that enhance the capabilities of their technologies.

Conclusion

Shiaw-Yu Jou's contributions to optical measurement systems and electronic devices demonstrate his commitment to innovation and excellence in technology. His patents reflect a deep understanding of the complexities involved in electronic design and measurement accuracy.

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