Company Filing History:
Years Active: 2012
Title: Shiano Ono: Innovator in Specimen Analysis Technology
Introduction
Shiano Ono is a notable inventor based in Kokubunji, Japan. He has made significant contributions to the field of specimen analysis technology, particularly in the design of innovative apparatuses used in electron microscopy.
Latest Patents
Ono holds a patent for a "Multi-part specimen holder with conductive patterns." This invention is designed for use in specimen analyzing apparatuses, such as transmission electron microscopes. The technology allows for the analysis of the structure, composition, and electron state of specimens by applying external voltage. The apparatus includes a specimen support with a mesh electrode and a specimen holder with a holder electrode, facilitating the application of voltage to the specimen.
Career Highlights
Shiano Ono is associated with Hitachi, Ltd., a leading company in technology and innovation. His work at Hitachi has allowed him to develop and refine his inventions, contributing to advancements in electron microscopy.
Collaborations
Ono has collaborated with notable colleagues, including Masanari Koguchi and Ruriko Tsuneta. These partnerships have fostered a collaborative environment that enhances innovation and research in their field.
Conclusion
Shiano Ono's contributions to specimen analysis technology exemplify the impact of innovative thinking in scientific research. His patent and work at Hitachi, Ltd. highlight the importance of collaboration and creativity in advancing technology.