Shaun S Gleason

Title: Shaun S. Gleason: Innovator in Semiconductor Analysis

Introduction

Shaun S. Gleason is a notable inventor based in Knoxville, TN (US). He has made significant contributions to the field of semiconductor analysis, particularly through his innovative patent. His work focuses on enhancing the efficiency and accuracy of defect detection in semiconductor manufacturing processes.

Latest Patents

Shaun S. Gleason holds a patent for "Automated defect spatial signature analysis for semiconductor." This invention provides an apparatus and method for performing automated defect spatial signature analysis on a data set that represents defect coordinates and wafer processing information. The process involves categorizing data into high-level categories, classifying the categorized data into user-labeled signature events, and correlating these events to identify present or incipient anomalous process conditions. He has 1 patent to his name.

Career Highlights

Gleason is associated with Lockheed Martin Energy Research Corporation and the Oak Ridge National Laboratory. His role in these organizations has allowed him to work on cutting-edge technologies and contribute to advancements in semiconductor research.

Collaborations

Throughout his career, Shaun has collaborated with esteemed colleagues, including Kenneth William Tobin, Jr. and Thomas P. Karnowski. These collaborations have further enriched his work and expanded the impact of his inventions.

Conclusion

Shaun S. Gleason's contributions to semiconductor analysis through his innovative patent demonstrate his commitment to advancing technology in this critical field. His work continues to influence the industry and pave the way for future innovations.