Company Filing History:
Years Active: 2025
Title: Innovations of Shaoqiang Lin in UPS Technology
Introduction
Shaoqiang Lin is a notable inventor based in Guangdong, China. He has made significant contributions to the field of electrical engineering, particularly in the development of uninterruptible power supply (UPS) systems. His innovative approach has led to the creation of a patented technology that enhances the reliability and efficiency of UPS relays.
Latest Patents
Shaoqiang Lin holds a patent for a "Soft start circuit of UPS relay." This invention includes a three-phase pre-charging module, a first PFC module, a second PFC module, a relay module, a three-phase input voltage detection module, a bus voltage detection module, and a relay control module. The relay control module is electrically connected to the three-phase input voltage detection module and the bus voltage detection module. It controls the connection of the relay module, allowing part of the relays to be turned on based on the A-phase, B-phase, C-phase input voltages, and the bus voltage. This design enables a soft start for the relay, ensuring it can be safely activated without damage from impact currents, even in cases of unbalanced input voltage.
Career Highlights
Shaoqiang Lin is currently employed at Vertiv Corporation, a company known for its expertise in power management and infrastructure solutions. His work at Vertiv has allowed him to apply his innovative ideas in real-world applications, contributing to the advancement of UPS technology.
Collaborations
One of his notable collaborators is Xiaolu Guo, with whom he has worked closely on various projects related to UPS systems. Their partnership has fostered a creative environment that encourages the development of cutting-edge technologies.
Conclusion
Shaoqiang Lin's contributions to UPS technology through his patented soft start circuit demonstrate his commitment to innovation in electrical engineering. His work not only enhances the functionality of UPS systems but also ensures their reliability in critical applications.