Seung-Jae Go

Title: Seung-Jae Go: Innovator in Wafer Defect Detection

Introduction

Seung-Jae Go is a notable inventor based in Suwan, South Korea. He has made significant contributions to the field of semiconductor manufacturing, particularly in the detection of defects in wafers. His innovative approach has the potential to enhance the efficiency and productivity of fabricating equipment.

Latest Patents

Seung-Jae Go holds a patent for a "Method of and apparatus for detecting a defect at the outer peripheral edge of a wafer, and cleaning equipment comprising the apparatus." This apparatus includes a rotary mechanism that allows the wafer to be rotated, a wafer edge contact device, and a controller. The wafer edge contact device features a string that is pressed against the edge of the wafer. One end of the string is fixed, while a sensor is associated with the other end to detect movement caused by defects. This invention enables the detection of defective edges before or after processing, preventing further damage and contamination of the fabricating equipment.

Career Highlights

Seung-Jae Go is currently employed at Samsung Electronics Co., Ltd., where he continues to innovate in the semiconductor industry. His work focuses on improving the quality and reliability of wafer processing.

Collaborations

Some of his notable coworkers include In-Suk Lee and Tae-Jun Kim, who contribute to the collaborative efforts in advancing technology at Samsung Electronics.

Conclusion

Seung-Jae Go's contributions to wafer defect detection exemplify the importance of innovation in the semiconductor industry. His patent not only addresses critical issues in wafer processing but also enhances overall operational efficiency.