Company Filing History:
Years Active: 2009
Title: Seung Hee Lee: Innovator in Liquid Crystal Display Technology
Introduction
Seung Hee Lee is a notable inventor based in Oviedo, Florida, recognized for his contributions to the field of liquid crystal display (LCD) technology. With a focus on enhancing display performance, he has developed innovative methods and systems that improve the functionality of LCD panels.
Latest Patents
Seung Hee Lee holds a patent for "Multi-domain vertical alignment liquid crystal displays with improved angular dependent gamma curves." This invention encompasses methods, systems, and apparatus for a liquid crystal display panel that features a first substrate with a color filter, an over-coating, and a common electrode. The second substrate includes an insulating layer surface facing the first substrate, a pixel electrode, and a plurality of common and pixel domain guides formed on the common and pixel electrodes. Additionally, the invention includes a liquid crystal layer vertically aligned between the first and second substrates, along with a drive circuit for applying voltage to control liquid crystal molecule orientation. This innovative design aims to enhance the performance of multi-domain liquid crystal display panels.
Career Highlights
Throughout his career, Seung Hee Lee has worked with esteemed organizations, including the University of Central Florida Research Foundation, Inc. and Chi Mei Optoelectronics Corporation. His experience in these institutions has allowed him to contribute significantly to advancements in display technology.
Collaborations
Seung Hee Lee has collaborated with notable colleagues, including Ruibo Lu and Shin-Tson Wu. Their combined expertise has furthered the development of innovative solutions in the field of liquid crystal displays.
Conclusion
Seung Hee Lee's work in liquid crystal display technology exemplifies the impact of innovation in enhancing visual display performance. His patent and collaborations reflect a commitment to advancing technology in this critical area.