Location History:
- Sonoma, CA (US) (1999)
- Sunnyvale, CA (US) (1999)
Company Filing History:
Years Active: 1999
Title: Scott Zheng: Innovator in Transistor Damage Detection
Introduction
Scott Zheng is a notable inventor based in Sonoma, CA, who has made significant contributions to the field of semiconductor technology. With a focus on detecting process-induced damage in transistors, he has been awarded 2 patents that showcase his innovative methods and techniques.
Latest Patents
One of Scott Zheng's latest patents is titled "Detection of process-induced damage on transistors in real time." This method involves measuring characteristics of a plurality of transistors, applying a constant voltage of a predetermined level for a specific duration, and re-measuring the characteristics to identify any damage. The predetermined voltage level is approximately 9 MV/cm, and the duration is about 1 second. A key aspect of this invention is measuring the threshold voltage, where a shift indicates damage. Another embodiment focuses on monitoring damage in unprotected transistors during wafer fabrication, utilizing a test sequence that integrates with the manufacturing process.
Additionally, he has developed a sensitive method for evaluating process-induced damage in MOSFETs. This technique employs a differential amplifier with multi-layer antennas of varying sizes to measure the difference in current, providing an accurate assessment of damage during manufacturing or as a quality measure for finished products.
Career Highlights
Scott Zheng is currently employed at Advanced Micro Devices Corporation, a leading company in the semiconductor industry. His work has been instrumental in advancing the understanding and detection of damage in transistors, which is crucial for improving the reliability and performance of electronic devices.
Collaborations
Scott has collaborated with esteemed colleagues such as Nguyen Duc Bui and Chenming Hu, contributing to the innovative research and development in the field of semiconductor technology.
Conclusion
Scott Zheng's contributions to the detection of process-induced damage in transistors highlight his role as an influential inventor in the semiconductor industry. His innovative patents and techniques continue to shape the future of electronic manufacturing.