Scott Mack

Title: Scott Mack - Innovator in Integrated Circuit Testing

Introduction

Scott Mack is a notable inventor based in Rochester, MN (US). He has made significant contributions to the field of integrated circuit testing, showcasing his expertise through his innovative patent.

Latest Patents

Scott Mack holds a patent titled "Method and apparatus for capture clock control to minimize toggling during testing." This patent describes a method of testing an integrated circuit device that involves detecting a number of integrated clock gates (ICGs) within the device. Each ICG can halt clock propagation in a specific branch of the clock tree. The method includes comparing the ICG fanout, which is the number of digital inputs that the output of each ICG can feed, with a threshold number of registers. If the ICG fanout exceeds the threshold, it is assessed whether the function-enable path of an existing ICG is timing-critical. If it is determined to be timing-critical, an additional ICG and a test point are inserted as a clock input to the existing ICG. Conversely, if the function-enable path is not timing-critical, a test point and an AND-gate may be inserted in that path.

Career Highlights

Scott Mack is currently employed at Marvell Asia Pte., Ltd., where he continues to develop innovative solutions in integrated circuit technology. His work has had a significant impact on the efficiency and effectiveness of testing integrated circuits.

Collaborations

Scott collaborates with Balaji Upputuri, a fellow innovator in the field. Their combined expertise contributes to advancements in integrated circuit testing methodologies.

Conclusion

Scott Mack is a distinguished inventor whose work in integrated circuit testing has led to valuable innovations. His patent reflects his commitment to improving testing methods, making a lasting impact in the field.