Philadelphia, PA, United States of America

Scott K Hartman


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 1987

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1 patent (USPTO):Explore Patents

Title: Scott K Hartman: Innovator in Optical Detection Technology

Introduction

Scott K Hartman is a notable inventor based in Philadelphia, PA. He has made significant contributions to the field of optical detection technology. His work focuses on enhancing the precision and cost-effectiveness of photometric instruments.

Latest Patents

Scott K Hartman holds a patent for an "Optical detector circuit for photometric instrument." This invention provides a high precision, low-cost A/D conversion of a detected optical signal. The design includes a sampled signal that is integrated in a sample signal integrator, while a reference signal is integrated in a reference signal integrator. By employing dual slope techniques, the integrated reference signal serves as an input to the sample signal integrator during a de-integration cycle. This process yields a ratio of the detected signal to the reference signal, which is particularly useful in nephelometers. Additionally, an inverted blanking signal may be integrated in the sample integrator to enhance the accuracy of the dual slope integration. The integration period is strategically selected to mitigate interference from primary noise sources, such as power line and fluorescent light frequencies.

Career Highlights

Scott K Hartman is currently associated with Cooper Biomedical, Inc., where he continues to innovate in the field of optical detection. His expertise and contributions have positioned him as a valuable asset in his organization.

Collaborations

Scott collaborates with Victor R Huebner, further enhancing the innovative capabilities within his team.

Conclusion

Scott K Hartman's work in optical detection technology exemplifies the impact of innovation in scientific instrumentation. His patent reflects a commitment to improving measurement accuracy and efficiency in photometric applications.

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