Sunnyvale, CA, United States of America

Scott Dylewski


Average Co-Inventor Count = 1.2

ph-index = 2

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 2013-2022

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5 patents (USPTO):Explore Patents

Title: Scott Dylewski: Innovator in Assay Test Strip Technologies

Introduction

Scott Dylewski is a notable inventor based in Sunnyvale, California. He has made significant contributions to the field of assay test strip technologies, holding a total of five patents. His work focuses on methods that enhance the accuracy and reliability of test results in various applications.

Latest Patents

Dylewski's latest patents include innovative methods for determining test result validity using a wavefront position on a test strip. This patent describes techniques for placing a liquid on the surface of an assay test strip and acquiring signals at various times. By comparing these signals to a threshold, the position of the liquid front can be determined, which is crucial for assessing the liquid front velocity and transit time across the test strip. Another significant patent involves methods for determining test result validity using fluid flow transit time across a test strip. This method also focuses on acquiring signals and comparing them to thresholds to ascertain the wavefront position and velocity of the liquid.

Career Highlights

Throughout his career, Scott Dylewski has worked with several companies, including Alverix, Inc. His experience in the industry has allowed him to develop and refine his innovative approaches to assay testing.

Collaborations

Dylewski has collaborated with notable professionals in his field, including Tong Xie and William Bilobran. These collaborations have contributed to the advancement of technologies related to assay test strips.

Conclusion

Scott Dylewski's contributions to assay test strip technologies through his patents and collaborations highlight his role as an influential inventor in this field. His innovative methods continue to impact the accuracy and reliability of test results in various applications.

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