Satohiro Hamano

Title: Innovations by Satohiro Hamano

Introduction

Satohiro Hamano is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of specimen inspection automation, holding two patents that enhance the efficiency and reliability of specimen processing.

Latest Patents

Hamano's latest patents include a "Specimen Inspection Automation System" and a "Specimen Inspection Method." The automation system allows for timely reporting of inspection results, even when a large number of urgent specimens are processed. It features an instruction reception unit that manages turnaround time (TAT) information and discharge instructions. This system ensures that specimens can be discharged efficiently, even in cases of congestion, by switching from automatic to manual processing when necessary. His second patent, the "Specimen Inspection Automation System and Method for Managing Empty Specimen Carrier," includes a conveyance line and a large-scale sample carrier buffer. This system is designed to optimize the management of sample carriers, ensuring that they are conveyed and stored effectively.

Career Highlights

Hamano is currently employed at Hitachi High-Tech Corporation, where he continues to innovate in the field of automation and specimen inspection. His work has significantly impacted the efficiency of laboratory processes, making it easier for healthcare professionals to manage specimen analysis.

Collaborations

Some of his notable coworkers include Shigeru Yano and Misato Fukami, who contribute to the collaborative environment at Hitachi High-Tech Corporation.

Conclusion

Satohiro Hamano's contributions to specimen inspection automation demonstrate his commitment to improving laboratory efficiency through innovative technology. His patents reflect a deep understanding of the challenges faced in specimen processing and offer practical solutions to enhance operational workflows.