Peekskill, NY, United States of America

Sankeerth Rajalingam

USPTO Granted Patents = 2 

Average Co-Inventor Count = 6.2

ph-index = 1


Company Filing History:


Years Active: 2019-2021

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2 patents (USPTO):

Title: Innovations of Sankeerth Rajalingam

Introduction

Sankeerth Rajalingam is an accomplished inventor based in Peekskill, NY (US). He holds 2 patents that showcase his expertise in the field of wafer test probes and organic probe substrates. His innovative contributions have made a significant impact in the technology sector.

Latest Patents

Sankeerth's latest patents include advancements in low-force wafer test probes. These embodiments describe structures of low-force wafer test probes and the methods for their formation. The structures consist of a lower base structure on top of a substrate and an upper blade structure positioned above the lower base structure. Notably, the design accommodates a crown of a C4 bump through either a cavity in the lower base structure or the height of the upper blade structure. The processes for fabricating these probe structures involve forming lower base structures on a substrate and constructing upper blade structures that include at least one blade with a cutting edge directed toward the center point of the probe structure. Additionally, he has developed an organic probe substrate structure that features a daughter card, an organic laminate attached to the daughter card, and multiple probes built onto the top surface of the organic laminate.

Career Highlights

Throughout his career, Sankeerth has worked with prominent companies such as IBM and Globalfoundries Inc. His experience in these organizations has allowed him to refine his skills and contribute to significant technological advancements.

Collaborations

Sankeerth has collaborated with notable coworkers, including David Michael Audette and S Jay Chey. These partnerships have further enriched his professional journey and fostered innovation in his projects.

Conclusion

Sankeerth Rajalingam is a notable inventor whose work in low-force wafer test probes and organic probe substrates demonstrates his commitment to innovation. His contributions continue to influence the technology landscape significantly.

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