Sam Won Chung

Title: Innovations of Sam Won Chung

Introduction

Sam Won Chung is a notable inventor based in Kyunggi-do, South Korea. He has made significant contributions to the field of wafer probing technology. His innovative approach has led to the development of a unique micro cantilever-type probe that enhances the efficiency and durability of probing systems.

Latest Patents

Sam Won Chung holds a patent for a micro cantilever style contact pin structure for wafer probing. This invention provides a micro cantilever-type probe that possesses the necessary elasticity and mechanical strength to recover its unforced shape after deformation during inspections. Remarkably, it maintains its original shape even after three hundred thousand uses. The probe card features an electrically insulated substrate fixed on a circuit board, a plurality of elastic probes with sharpened ends, and wiring formed on the probe, insulated substrate, and circuit board. The manufacturing process involves patterning a substrate using photolithography and etching, followed by coating the probe with metal layers.

Career Highlights

Sam Won Chung is associated with Amst Company Limited, where he continues to innovate in the field of wafer probing technology. His work has been instrumental in advancing the capabilities of probing systems used in various applications.

Collaborations

Some of his coworkers include Dong Il Kim and Young Kyum Ahn, who contribute to the collaborative efforts at Amst Company Limited.

Conclusion

Sam Won Chung's contributions to the field of wafer probing technology exemplify the spirit of innovation. His patented micro cantilever-type probe represents a significant advancement in the industry, showcasing his dedication to improving technology.