Saratoga, CA, United States of America

S Fred Dabney, Jr


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 23(Granted Patents)


Company Filing History:


Years Active: 1996

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1 patent (USPTO):Explore Patents

Title: S Fred Dabney, Jr: Innovator in Capacitance Measurement Technology.

Introduction

S Fred Dabney, Jr. is a notable inventor based in Saratoga, CA (US). He has made significant contributions to the field of electronics, particularly in the measurement of capacitance. His innovative approach has led to the development of a unique capacitance measuring device.

Latest Patents

Dabney holds a patent for a "Method and apparatus to measure capacitance." This capacitance measuring device incorporates an integrating analog-digital converter circuit of a handheld meter. The device charges an unknown capacitance with a constant current until the voltage across the unknown capacitor reaches a predetermined voltage. Simultaneously, a reference voltage is applied to the input lead of the integrating circuit, allowing for proportional charge storage in the feedback capacitor. The negative of the reference voltage is then applied to the integrating circuit, enabling the removal of charge from the feedback capacitor at the same rate it was charged. A counter determines the number of clock pulses required to completely discharge the feedback capacitor, allowing for the calculation of the unknown capacitance.

Career Highlights

Dabney is associated with Telcom Semiconductor, Inc., where he has contributed his expertise in electronic measurement technologies. His work has been instrumental in advancing the capabilities of capacitance measurement devices.

Collaborations

One of his notable coworkers is Amado A Caliboso, with whom he has likely collaborated on various projects within the company.

Conclusion

S Fred Dabney, Jr. is a distinguished inventor whose work in capacitance measurement technology has made a lasting impact in the field of electronics. His innovative patent showcases his commitment to advancing measurement techniques.

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