Capelle aan den Ijssel, Netherlands

Roelof Willem Herfst


 

Average Co-Inventor Count = 3.2

ph-index = 1


Location History:

  • Capelle aan den IJssel, NL (2022 - 2023)
  • Capelle aan den Ussel, NL (2023)
  • Capelle a/d Ijssel, NL (2023)

Company Filing History:


Years Active: 2022-2024

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5 patents (USPTO):Explore Patents

Roelof Willem Herfst: Innovator in Scanning Probe Microscopy

Introduction

Roelof Willem Herfst is a distinguished inventor based in Capelle aan den Ijssel, Netherlands. With a notable contribution to the field of scanning probe microscopy, he holds five patents that showcase his innovative spirit and technical expertise.

Latest Patents

Among his latest patents are a variety of groundbreaking technologies related to the scanning probe microscopy device. These include a *probe chip* designed to hold a probe mounted thereon, which boasts a carrier element that features a probe-bearing side and a mounting side for easy integration with a scanning probe microscopy device.

Another significant patent focuses on a *probe cassette* that facilitates the automated transfer of the probe to the scanning probe microscope’s mount. This device includes dual vacuum chambers designed to maintain precise mounting positions during transitions.

Career Highlights

Roelof Willem Herfst's work is primarily associated with the Netherlands Organization for Applied Scientific Research (TNO). His innovations have significantly impacted the efficiency and functionality of scanning probe microscopy devices, thereby enhancing the capabilities for scientific exploration and research.

Collaborations

Throughout his career, Herfst has collaborated with notable professionals including Anton Adriaan Bijnagte and Jan Jacobus Benjamin Biemond. Their joint efforts have further advanced the technology in probe microscopy, allowing for more sophisticated designs and implementations in various scientific applications.

Conclusion

In conclusion, Roelof Willem Herfst is not only an inventor but a pivotal figure in the advancement of scanning probe microscopy technology. His patents reflect a commitment to innovation and a deep understanding of the technical challenges in the field, marking him as a key contributor to the scientific community.

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