Waltham, MA, United States of America

Robert T Schulein


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Innovations of Robert T Schulein

Introduction

Robert T Schulein is an accomplished inventor based in Waltham, MA (US). He has made significant contributions to the field of imaging technology, particularly in the area of three-dimensional visualization. His innovative work has led to the development of a unique system that enhances the ability to visualize objects within scattering mediums.

Latest Patents

Robert T Schulein holds a patent for a system and methods for three-dimensional imaging of objects in a scattering medium. This patent describes a system that includes a sensor for receiving light from an object in a scattering medium. The system is coupled to a computing device that processes a plurality of elemental images received from the sensor. The computing device magnifies these elemental images through a virtual pin-hole array, creating an overlapping pattern of magnified images. Additionally, it averages overlapping portions of the elemental images to form an integrated image, enhancing the clarity and detail of the visualization.

Career Highlights

Robert T Schulein is affiliated with the University of Connecticut, where he continues to contribute to research and development in imaging technologies. His work has garnered attention for its innovative approach to overcoming challenges in visualizing objects obscured by scattering mediums.

Collaborations

Robert has collaborated with notable colleagues, including Bahram Javidi and Inkyu Moon. Their combined expertise has further advanced the research and applications of three-dimensional imaging technologies.

Conclusion

Robert T Schulein's contributions to the field of imaging technology exemplify the impact of innovative thinking in scientific research. His patented system for three-dimensional visualization represents a significant advancement in the ability to analyze objects within scattering mediums.

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