Berwyn, IL, United States of America

Ricardo Murguia


Average Co-Inventor Count = 4.8

ph-index = 7

Forward Citations = 388(Granted Patents)


Location History:

  • Berywn, IL (US) (2004)
  • Berwyn, IL (US) (2001 - 2005)
  • Schaumburg, IL (US) (2010)

Company Filing History:


Years Active: 2001-2010

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19 patents (USPTO):Explore Patents

Title: Ricardo Murguia: A Talented Innovator in Height Measurement Solutions

Introduction:

Ricardo Murguia, hailing from Berwyn, IL in the United States, is a prolific inventor known for his expertise in developing innovative height measurement solutions. With a remarkable total of 19 patents to his name, Murguia has continuously pushed the boundaries of precision measurement devices. In this article, we will explore his latest patents, career highlights, notable collaborations, and the impact of his inventions on the field.

Latest Patents:

Among Murguia's most recent patents, two stand out as exceptional contributions in the domain of height measurement:

1. Height Scale:

Murguia's height scale design revolutionizes the precision and usability of these essential measuring instruments. The height scale incorporates a base, column assembly, and a height rod assembly. Notably, the lever assembly in the height rod assembly features a lever, a lever bracket, and a rod cap with self-locking release tabs. This innovation enhances the accuracy and ease of measuring height, making it an invaluable tool in various settings, including healthcare and fitness facilities.

2. Beam Scale with User-Friendly Features:

Murguia's beam scale encompasses both body weight and height measurements. The device consists of a frame containing a base assembly, pillar assembly, and horn assembly. The weighing mechanism, housed within the frame, includes a beam, weights, and a lever assembly. Notably, the horn assembly features a transparent holding bracket with a level indicator. The scale also includes a height measurement assembly with a height rod, sheath, measuring arm, and a transparent height-measuring window. Murguia's beam scale design incorporates user-friendly elements, such as a quick assembly mechanism, quiet wheels, and handlebars for added convenience during use.

Career Highlights:

Throughout his career, Ricardo Murguia has demonstrated remarkable creativity and expertise within the field of measurement devices. Some of his notable career highlights include his contributions as an inventor at Sunbeam Products, Inc. Murguia's inventive spirit and dedication to precision measurement solutions have consistently earned him recognition among his peers and industry professionals.

Collaborations:

Ricardo Murguia has had the opportunity to collaborate with esteemed colleagues over the years. Two of his notable coworkers include:

1. James G Montagnino:

Montagnino's expertise and shared passion for innovative solutions blend seamlessly with Murguia's pursuits. Their collaboration has likely contributed significantly to the success of Murguia's inventions.

2. Anson Wong:

Wong's expertise, combined with Murguia's inventive mindset, has undoubtedly fostered groundbreaking ideas and advancements in height measurement solutions. Their collaborative efforts likely facilitated the development of Murguia's patented designs.

Conclusion:

Ricardo Murguia's outstanding contributions to height measurement devices have left an indelible mark on the industry. Through his inventive designs, Murguia has demonstrated an unwavering commitment to improving accuracy, usability, and convenience. With a remarkable list of patents and notable collaborations, Murguia continues to inspire a new generation of innovators in the field of measurement technology.

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