Boucherville, Canada

René Héon


Average Co-Inventor Count = 3.4

ph-index = 1

Forward Citations = 26(Granted Patents)


Company Filing History:


Years Active: 2005-2018

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2 patents (USPTO):Explore Patents

Title: The Innovative Contributions of René Héon

Introduction

René Héon is a notable inventor based in Boucherville, Canada. He has made significant contributions to the field of laser-induced breakdown spectroscopy (LIBS), with a focus on methods and apparatus for analyzing materials. His work has led to the development of two patents that enhance the accuracy and efficiency of material analysis.

Latest Patents

Héon's latest patents include a "Method for Laser-Induced Breakdown Spectroscopy and Calibration" and a "Method and Apparatus for Molten Material Analysis by Laser Induced Breakdown Spectroscopy." The first patent outlines a method for LIBS calibration that involves providing a range of reference samples with known analyte concentrations. By assaying these samples, Héon establishes a calibration curve that improves the accuracy of LIBS assays. The second patent presents an innovative apparatus designed for real-time analysis of molten materials. This method utilizes a forced gas flow to create a bubble within the molten material, allowing for accurate composition analysis even under challenging conditions.

Career Highlights

Throughout his career, René Héon has worked with esteemed organizations such as the National Research Council of Canada and Noranda Inc. His experience in these institutions has contributed to his expertise in material analysis and spectroscopy.

Collaborations

Héon has collaborated with notable colleagues, including Mohamad Sabsabi and John M. Lucas. These partnerships have furthered his research and development efforts in the field of LIBS.

Conclusion

René Héon's innovative work in laser-induced breakdown spectroscopy has significantly advanced the methods used for material analysis. His patents reflect a commitment to improving accuracy and efficiency in this important field.

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