Company Filing History:
Years Active: 2013
Title: Reed W Adams: Innovator in ESD Protection Circuits
Introduction
Reed W Adams is a notable inventor based in Mountain View, CA (US). He has made significant contributions to the field of electronics, particularly in the area of ESD (Electrostatic Discharge) protection circuits. His innovative work has led to the development of a patent that enhances the reliability of switching power converters.
Latest Patents
Reed W Adams holds a patent for an "ESD protection circuit for a switching power converter." This invention includes a high-side switching element connected between a supply voltage and the switching node, as well as a low-side switching element connected between the switching node and a common node. The design features a current conduction path that couples an ESD event occurring on the switching node to an ESD sense node. An ESD sensing circuit linked to the sense node generates a trigger signal when an ESD event is detected. A first logic gate ensures that the high-side switching element remains off when the trigger signal indicates an ESD event, while a second logic gate activates the low-side switching element to provide a conductive discharge path between the switching node and the common node. This innovative approach significantly improves the protection of electronic devices against ESD events.
Career Highlights
Reed W Adams is currently employed at Analog Devices, Inc., where he continues to work on cutting-edge technologies in the electronics sector. His expertise in ESD protection circuits has positioned him as a valuable asset to his team and the company.
Collaborations
Reed has collaborated with talented coworkers such as James Zhao and Kenji Tomiyoshi. Their combined efforts contribute to the advancement of technology in their field.
Conclusion
Reed W Adams is a distinguished inventor whose work in ESD protection circuits has made a significant impact on the electronics industry. His innovative patent demonstrates his commitment to enhancing the reliability of electronic devices.