Raghuveer Ausoori

Title: Innovations of Raghuveer Ausoori in Integrated Circuit Testability

Introduction

Raghuveer Ausoori is an accomplished inventor based in Highland Park, NJ (US). He has made significant contributions to the field of integrated circuit testability, particularly through his innovative patent that enhances the design for testability (DFT) of circuits. His work focuses on improving the efficiency and effectiveness of testing large circuits, which is crucial in the ever-evolving landscape of technology.

Latest Patents

Raghuveer Ausoori holds a patent titled "Spectral and information theoretic method of test point, partial-scan, and full-scan flip-flop insertion to improve integrated circuit testability." This patent describes DFT algorithms that utilize both gradient descent and linear programming (LP) techniques to insert test points (TPs) and/or scanned flip-flops (SFFs) into large circuits, making them testable. The algorithms support the scanning of either all flip-flops or a subset of flip-flops. They measure testability using probabilities derived from logic simulation, Shannon's entropy measure from information theory, and spectral analysis of the circuit in the frequency domain. The DFT hardware inserter methods leverage toggling rates of the flip-flops, analyzed using digital signal processing (DSP) methods, and Shannon entropy measures to select flip-flops for scanning. The optimal insertion of DFT hardware minimizes the additional circuit hardware required for test points and scan flip-flops.

Career Highlights

Raghuveer Ausoori is affiliated with Rutgers, the State University of New Jersey, where he continues to contribute to advancements in integrated circuit design and testing methodologies. His innovative approaches have garnered attention in the field, showcasing his expertise and commitment to enhancing circuit testability.

Collaborations

Some of his notable coworkers include Michael L. Bushnell and Omar Khan, who have collaborated with him on various projects related to integrated circuit design and testing.

Conclusion

Raghuveer Ausoori's contributions to integrated circuit testability through his innovative patent demonstrate his expertise and commitment to advancing technology. His work not only enhances the efficiency of testing large circuits but also paves the way for future innovations in the field.