Quoc Ly

Title: Quoc Ly: Innovator in Scanning Probe Microscopy

Introduction

Quoc Ly is a notable inventor based in San Jose, California, recognized for his contributions to the field of scanning probe microscopy. He holds two patents that enhance optical visualization and sample manipulation capabilities in microscopy.

Latest Patents

Quoc Ly's latest patents include an optical microscope stage for scanning probe microscopes. This invention features improved optical visualization and sample manipulation capabilities. The scanning probe microscopes (SPMs) and scanning probe heads include at least one flexure stage for scanning in the x, y, and z directions. In a preferred embodiment, the SPMs or SPM heads incorporate flexure stages for scanning in all three dimensions. The z scanning stage is strategically positioned outside the lateral footprint of the x-y flexure stage, allowing a probe extending from the z scanning stage to remain unobstructed. These SPMs and SPM heads are designed to provide both top-down and bottom-up optical views of the sample and/or the probe, enabling simultaneous scanning probe microscopy and optical imaging. Furthermore, they are readily combinable with existing upright and inverted optical microscopes from various major manufacturers.

Career Highlights

Throughout his career, Quoc Ly has worked with prominent companies in the field, including Thermomicroscopes Corporation and Park Scientific Instruments. His work has significantly advanced the capabilities of scanning probe microscopy.

Collaborations

Quoc Ly has collaborated with notable colleagues such as David Braunstein and Michael D. Kirk, contributing to the development of innovative microscopy technologies.

Conclusion

Quoc Ly's contributions to scanning probe microscopy through his patents and collaborations have made a significant impact in the field. His work continues to influence advancements in optical visualization and sample manipulation.