Beijing, China

Qinglang Meng


Average Co-Inventor Count = 2.5

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2022-2024

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5 patents (USPTO):

Title: Qinglang Meng: Innovator in Electron Microscopy

Introduction

Qinglang Meng is a prominent inventor based in Beijing, China. He has made significant contributions to the field of electron microscopy, holding a total of five patents. His work focuses on advancing the technology used in scanning electron microscopes and electron beam inspection apparatuses.

Latest Patents

Qinglang Meng's latest patents include a scanning electron microscope device and an electron beam inspection apparatus. These innovations are designed to project an electron beam onto a sample's surface, generating backscattered and secondary electrons. The scanning electron microscope device features an electron beam source, a deflection mechanism, and an objective lens assembly. The deflection mechanism consists of multiple deflectors, including a first deflector located downstream of the electron beam source and a second deflector downstream of the first. The objective lens assembly includes an excitation coil and a magnetic yoke, which is formed from magnetizer material and opens towards the sample. This assembly also contains an internal chamber for the excitation coil and at least one inclined portion that directs towards the optical axis. Additionally, the deflection mechanism incorporates a compensation electrode to adjust the focusing position of the electron beam.

Career Highlights

Qinglang Meng has worked with Zhongke Jingyuan Electron Limited in Beijing, where he has contributed to the development of advanced electron microscopy technologies. His expertise in this field has positioned him as a key figure in the innovation of electron beam inspection systems.

Collaborations

Qinglang has collaborated with notable professionals in his field, including Weiqiang Sun and Yan Zhao. Their combined efforts have furthered advancements in electron microscopy technology.

Conclusion

Qinglang Meng's contributions to the field of electron microscopy through his innovative patents and career achievements highlight his role as a leading inventor in this specialized area. His work continues to influence advancements in scientific research and technology.

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