Company Filing History:
Years Active: 2009
Title: Innovations of Qingkai Yu in Silicon Cantilever Technology
Introduction
Qingkai Yu is an accomplished inventor based in Houston, Texas. He has made significant contributions to the field of atomic force microscopy through his innovative work on silicon cantilevers. His research focuses on enhancing the performance of these cantilevers for improved imaging and measurement capabilities.
Latest Patents
Qingkai Yu holds a patent for a "Short and thin silicon cantilever with tip and fabrication thereof." This invention addresses the need for cantilevers that possess both a low force constant and a high resonance frequency, making them highly desirable for atomic force microscope (AFM) imaging and force measurement. The patent describes small silicon cantilevers integrated with a silicon tip, fabricated from silicon-on-insulator (SOI) wafers. This fabrication process allows for the production of SOI chips containing 40 silicon cantilevers, each integrating an ultra-sharp silicon tip. The resolution of images obtained with these tips surpasses that of commercial alternatives, while the lower force constants make them more suitable for imaging soft samples. The availability of such SOI chips facilitates large-scale modification of the cantilever tips' surfaces with a monolayer of oligo(ethylene glycol) derivatives, which resist non-specific interactions with proteins, making them ideal for biological sample imaging and measurement.
Career Highlights
Qingkai Yu is affiliated with the University of Houston System, where he continues to advance research in the field of nanotechnology and materials science. His work has garnered attention for its practical applications in various scientific and medical fields.
Collaborations
Qingkai Yu has collaborated with notable colleagues, including Chengzhi Cai and Chi-Ming Yam, contributing to the advancement of research in their respective areas of expertise.
Conclusion
Qingkai Yu's innovative work on silicon cantilevers represents a significant advancement in atomic force microscopy technology. His contributions enhance the capabilities of imaging and measurement, particularly in biological applications.