Qing-Tang Jiang

Title: Qing-Tang Jiang: Innovator in Electron Beam Testing Technology

Introduction

Qing-Tang Jiang is a notable inventor based in Sunnyvale, CA, who has made significant contributions to the field of electronic testing. His innovative approach to testing interconnect networks in multichip modules has led to the development of a unique patent that enhances the reliability of electronic components.

Latest Patents

Qing-Tang Jiang holds a patent for a "Switch potential electron beam substrate tester." This invention describes a method for testing the interconnect networks of a multichip module for opens and shorts. The process involves an electron beam interrogating a pad on an interconnect network located on a substrate. The emitted secondary electrons are measured to determine the integrity of the interconnect network. The test time is compared to a reference value to assess whether the network is defect-free, open, or shorted.

Career Highlights

Qing-Tang Jiang is currently employed at Alcedo, Inc., where he continues to innovate in the field of electronic testing. His work has been instrumental in advancing the technology used to ensure the reliability of electronic components in various applications.

Collaborations

Qing-Tang Jiang has collaborated with notable colleagues, including Auguste B El-Kareh and MingYang Li, contributing to the development of advanced testing methodologies.

Conclusion

Qing-Tang Jiang's contributions to electron beam testing technology exemplify the importance of innovation in ensuring the reliability of electronic components. His work continues to influence the field and pave the way for future advancements.