Qing Huan

Title: Qing Huan: Innovator in Scanning Probe Microscopy

Introduction

Qing Huan is a notable inventor based in Beijing, China. He has made significant contributions to the field of microscopy, particularly through his innovative designs and patents. His work focuses on enhancing the functionality and reliability of scanning probe microscopes.

Latest Patents

Qing Huan holds a patent for a scanning head of a scanning probe microscope. This invention includes a scanning head frame with a first and second end portion, defining two receiving spaces. A sample table is located in the first receiving space, while a scanning module is situated in the second receiving space. The design features a plurality of fixed electrodes on the second end portion of the scanning head frame. Notably, the signal lines of this scanning head do not fall off or tear during operation. Additionally, the scanning head allows a laser to be incident on its scanning probe, broadening its range of applications. He has 1 patent to his name.

Career Highlights

Qing Huan is affiliated with the Chinese Academy of Sciences, where he conducts his research and development work. His role at this prestigious institution has allowed him to explore various innovative solutions in the field of microscopy.

Collaborations

Qing Huan has worked alongside talented colleagues, including Zebin Wu and Hongjun Gao. Their collaborative efforts have contributed to advancements in their respective fields.

Conclusion

Qing Huan's contributions to scanning probe microscopy exemplify the spirit of innovation in scientific research. His patented designs enhance the functionality of microscopy tools, paving the way for future advancements in the field.