Shenzhen, China

Qiang Mei


Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2015

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1 patent (USPTO):

Title: Qiang Mei - Innovator in Flatness Measurement Technology

Introduction

Qiang Mei is a notable inventor based in Shenzhen, China. He has made significant contributions to the field of precision measurement technology. His innovative approach has led to the development of a unique flatness measuring apparatus.

Latest Patents

Qiang Mei holds a patent for a flatness measuring apparatus. This apparatus includes a measuring assembly and a movable assembly. The measuring assembly features a measuring unit that consists of a supporting base, a loading block, and a limiting block mounted above the supporting base. The supporting base defines a receiving hole, where the loading block is removably received. The loading block is coplanar with the supporting base and cooperatively defines a limiting channel. A critical aspect of this invention is that the distance between the limiting block and the supporting base is substantially the same as the maximum allowable height of a workpiece. This design ensures that only qualified workpieces can slide through, while unqualified workpieces are caught.

Career Highlights

Throughout his career, Qiang Mei has worked with prominent companies in the industry. He has been associated with Shenzhen Futaihong Precision Industry Co., Ltd. and Fih (Hong Kong) Limited. His experience in these organizations has contributed to his expertise in precision measurement technologies.

Collaborations

Qiang Mei has collaborated with talented individuals in his field, including Jin-Shan Cui and Ming Li. These collaborations have likely enhanced his innovative capabilities and contributed to the success of his projects.

Conclusion

Qiang Mei's contributions to the field of flatness measurement technology demonstrate his innovative spirit and dedication to precision engineering. His patent for the flatness measuring apparatus showcases his ability to solve complex problems in manufacturing processes.

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