Noida, India

Pragya Shukla


Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: **Pragya Shukla: Innovator in Semiconductor Testing Methods**

Introduction

Pragya Shukla is a prominent inventor based in Noida, India, known for her significant contributions to semiconductor technology. With a focus on enhancing testing methods, she has successfully patented a unique approach that addresses small delay defects in semiconductor processors. Her work represents a crucial advancement in ensuring the reliability and efficiency of electronic devices.

Latest Patents

Pragya holds a patent for a groundbreaking method titled "Method of generating test patterns for detecting small delay defects." This invention introduces a novel way to generate test patterns aimed at detecting small delay defects (SDD) in semiconductor processors. The method involves modifying interconnect delay values of interconnect paths by incorporating values related to both set-up and clock to Q delays of elements, as well as the latencies of associated clock networks. Critical nodes are selected through static timing analysis, targeting only those nodes which are deemed crucial in both at-speed scan mode and functional mode testing.

Career Highlights

Pragya Shukla is associated with Freescale Semiconductor, Inc., a leading company in the semiconductor industry. There, she has taken on the role of driving innovation and contributing to the development of advanced testing methodologies. Her experience and expertise in semiconductor testing have positioned her as a key player in her field.

Collaborations

Throughout her career, Pragya has collaborated with notable colleagues, including Anurag Jindal and Naman Gupta. Their teamwork has helped in refining testing processes and developing solutions that enhance the performance of semiconductor devices.

Conclusion

Pragya Shukla’s contributions to semiconductor testing represent a vital step forward in the quest for reliable electronic devices. Her patented method of generating test patterns specifically aimed at detecting small delay defects not only showcases her innovative spirit but also highlights the importance of rigorous testing in the technology sector. As the industry continues to evolve, inventors like Pragya play an essential role in shaping the future of electronics.

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