Guangdong, China

Ping Lai

USPTO Granted Patents = 1 

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Innovations by Ping Lai in Electronic Component Fault Analysis

Introduction

Ping Lai is an accomplished inventor based in Guangdong, China. He has made significant contributions to the field of electronic component fault analysis. His innovative approach has led to the development of a unique method and system that enhances the diagnosis of electronic component failures.

Latest Patents

Ping Lai holds a patent for a "Method and system of close-loop analysis to electronic component fault problem." This invention provides a comprehensive system for performing close-loop analysis on electronic component failures. The system establishes an electronic component fault tree based on the physics of failure, converting it into a failure locating fault tree. It also creates an electronic component fault dictionary that correlates the cause of failure mechanisms with failure characteristics. This innovative method allows for the precise location of faults within the internal physical structure of electronic components, enabling quick identification of failure mechanisms and facilitating accurate diagnosis.

Career Highlights

Ping Lai is currently employed at the Fifth Electronics Research Institute of the Ministry of Industry and Information Technology. His work focuses on advancing technologies related to electronic components and their reliability. His expertise in fault analysis has positioned him as a key figure in his field.

Collaborations

Ping Lai collaborates with talented coworkers, including Xiaoqi He and Yunfei En. Their combined efforts contribute to the ongoing research and development in electronic component technologies.

Conclusion

Ping Lai's innovative contributions to electronic component fault analysis demonstrate his expertise and commitment to advancing technology in this critical area. His patent reflects a significant step forward in diagnosing electronic failures, showcasing the importance of innovation in engineering.

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