Location History:
- Luik, BE (2004)
- Leuven, BE (2017)
Company Filing History:
Years Active: 2004-2017
Title: Pierre Eyben: Innovator in Atomic Force Microscopy
Introduction
Pierre Eyben is a notable inventor based in Leuven, Belgium. He has made significant contributions to the field of atomic force microscopy and has been awarded 2 patents for his innovative methods and apparatuses. His work has advanced the understanding and application of scanning spreading resistance measurement techniques.
Latest Patents
Pierre Eyben's latest patents include a "Method for determining local resistivity and carrier concentration using scanning spreading resistance measurement set-up." This patent describes an SSRM method for measuring the local resistivity and carrier concentration of a conductive sample. The method involves contacting the conductive sample with an AFM probe and a contact electrode, modulating the force applied to maintain contact, and measuring the current flowing through the sample to derive the modulated spreading resistance.
Another significant patent is the "Method and apparatus for performing atomic force microscopy measurements." This invention relates to a method and apparatus for conducting atomic force microscopy. The method defines a force profile and scans a sample with the AFM probe, changing the force according to the predefined profile. The invention also includes an apparatus designed to perform this method effectively.
Career Highlights
Throughout his career, Pierre Eyben has worked with prominent organizations such as the Interuniversity Microelectronics Centre (imec) and Imec. His experience in these institutions has allowed him to collaborate with leading experts in the field and contribute to groundbreaking research.
Collaborations
Pierre has collaborated with notable colleagues, including Wilfried B Vandervorst and Ruping Cao. These collaborations have further enriched his work and have led to advancements in atomic force microscopy techniques.
Conclusion
Pierre Eyben is a distinguished inventor whose contributions to atomic force microscopy and related fields have been recognized through his patents. His innovative methods continue to influence research and development in the scientific community.