Company Filing History:
Years Active: 2020
Title: The Innovations of Philipp Nimtsch
Introduction
Philipp Nimtsch is an accomplished inventor based in Gießen, Germany. He has made significant contributions to the field of optical measurement technology. His innovative work has led to the development of a unique optical measuring device that addresses specific challenges in measuring the thickness of intransparent layers on substrates.
Latest Patents
Nimtsch holds a patent for an optical measuring device and method. This invention relates to a device designed for the optical measurement of the thickness of an intransparent layer on a substrate. The device includes first means for optical distance measurement, which measures the distance between a reference plane and the surface of the intransparent layer. Additionally, it features second means for optical distance measurement that measures the distance between a second reference plane and the second surface of the intransparent layer. The device also computes the thickness of the intransparent layer by utilizing these measurements, while accounting for the optical effects of the substrate.
Career Highlights
Philipp Nimtsch is currently employed at Precitec Optronik GmbH, where he continues to innovate in the field of optical measurement. His work has been instrumental in advancing the technology used in various applications, enhancing the accuracy and reliability of measurements in complex environments.
Collaborations
Nimtsch collaborates with Simon Mieth, a fellow professional in the field. Their partnership has fostered a creative environment that encourages the development of cutting-edge technologies.
Conclusion
Philipp Nimtsch's contributions to optical measurement technology exemplify the spirit of innovation. His patented device not only addresses practical challenges but also enhances the understanding of measurement techniques in various applications. His work at Precitec Optronik GmbH continues to pave the way for future advancements in this critical field.