North Tonawanda, NY, United States of America

Peter W Raffelsberger


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 1983

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1 patent (USPTO):Explore Patents

Title: Innovations by Peter W Raffelsberger

Introduction

Peter W Raffelsberger is an accomplished inventor based in North Tonawanda, NY (US). He has made significant contributions to the field of measurement technology, particularly in the area of coating thickness measurement. His innovative approach has led to the development of a unique method and apparatus that enhances the efficiency of measuring coating thicknesses on continuously moving strip materials.

Latest Patents

Peter W Raffelsberger holds a patent for a "Method and apparatus for measuring coating thicknesses on continuously." This invention utilizes radiation techniques to measure coating thicknesses on strip materials as they travel along a predetermined path without altering that path. The system includes a shuttle that carries a measuring probe equipped with a radioactive isotope source and a detection device. This shuttle is designed to engage with the strip for synchronous movement during measurement cycles and disengage when not in use, allowing for precise measurements without interference.

Career Highlights

Throughout his career, Raffelsberger has demonstrated a commitment to innovation and excellence. His work at Twin City International, Inc. has positioned him as a key player in the development of advanced measurement technologies. His patent reflects his ability to combine technical knowledge with practical applications, resulting in solutions that meet industry needs.

Collaborations

Peter has collaborated with notable colleagues, including James A Holler and William B Stanton. These partnerships have fostered an environment of creativity and innovation, contributing to the success of their projects and advancements in measurement technology.

Conclusion

Peter W Raffelsberger's contributions to the field of measurement technology are noteworthy. His innovative patent showcases his expertise and commitment to improving industry standards. Through his work, he continues to influence the future of coating thickness measurement.

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