Company Filing History:
1 out of 3,975 
1 out of 2,546 
Years Active: 1992-1993
Title: Innovations of Peter W Kushnick
Introduction
Peter W Kushnick is an accomplished inventor based in Williamsburg, VA (US). He holds 2 patents that showcase his expertise in measuring devices and material characterization. His work has significantly contributed to advancements in technology and engineering.
Latest Patents
One of his latest patents is the "Constant frequency pulsed phase-locked loop measuring device." This innovative apparatus utilizes a fixed frequency oscillator to measure small changes in the phase velocity of ultrasonic sound when a sample is subjected to environmental changes such as pressure and temperature variations. The invention is designed to automatically balance electrical phase shifts against acoustical phase shifts, ensuring accurate measurements of electrical phase shifts.
Another notable patent is the "Method of characterizing residual stress in ferromagnetic materials." This invention provides a method and apparatus for characterizing residual uniaxial stress in a ferromagnetic test member. It distinguishes between residual stresses resulting from positive (tension) forces and negative (compression) forces by employing distinct magnetoacoustic (MAC) and a novel magnetoacoustic emission (MAE) measurement circuit means. A switch allows for the selective operation of the respective circuit means.
Career Highlights
Throughout his career, Peter has worked with various organizations, including the United States of America as represented by the United States and the United States of America as represented by the Administrator. His contributions have been instrumental in advancing the field of measurement and material science.
Collaborations
Peter has collaborated with notable individuals such as William T Yost and John H Cantrell. Their combined expertise has fostered innovation and development in their respective fields.
Conclusion
Peter W Kushnick's contributions to the field of invention are noteworthy, particularly in the areas of measurement devices and material characterization. His patents reflect a commitment to advancing technology and improving measurement accuracy.