Mainz, Germany

Peter Pokrowsky


Average Co-Inventor Count = 4.8

ph-index = 1

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 1996-1999

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2 patents (USPTO):Explore Patents

Title: Innovations of Peter Pokrowsky

Introduction

Peter Pokrowsky is a notable inventor based in Mainz, Germany. He has made significant contributions to the field of technology, particularly in the development of devices that analyze magnetic characteristics. With a total of 2 patents, his work has garnered attention in various scientific communities.

Latest Patents

Pokrowsky's latest patents include a "Process and device for determining the magnetic characteristics of thin films" and a "Micropolarimeter, microsensor system and method of characterizing thin films." The micropolarimeter consists of an analyzer and a detector, typically a photodetector array. The detector features a circular configuration of a number N of sectors. The analyzer assigns different polarization values to these sectors, and both components contain no moving parts. Three different embodiments are proposed for the analyzer: a glass cone covered with a polarizing thin film stack, a metal grid polarizing array, and an array of polarizing waveguides. This micropolarimeter is preferably used in a microellipsometer system, serving as a tool for film diagnostics, especially for the optical characterization of thin films.

Career Highlights

Pokrowsky is associated with the International Business Machines Corporation, commonly known as IBM. His work at IBM has allowed him to explore innovative technologies and contribute to advancements in the field.

Collaborations

Throughout his career, Pokrowsky has collaborated with notable colleagues, including Eckehard Kiefer and Michael Abraham. These collaborations have further enriched his research and development efforts.

Conclusion

Peter Pokrowsky's contributions to technology through his patents and collaborations highlight his role as an influential inventor. His work continues to impact the field of optical characterization and magnetic analysis.

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